Dr. Mark Biesinger is smiling from ear-to-ear with his new, fully functioning, Kratos AXIS Supra (XPS) surface analysis instrument! This piece of equipment is capable of: * Large area, high sensitivity XPS * Small spot, selected area spectroscopy * High energy resolution * Fast parallel imaging * Unrivalled instrument automation For more information: Here
The P-17 offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R&D environments. The system supports 2D and 3D measurements of step heights, roughness, bow and stress for scans up to 200mm without stitching.
With incredible features including: • Cold field emission (CFE) gun optimized for low-voltage, high-resolution imaging with low aberration • Maximum magnification doubled from 1 million times to 2 million times *2 • User-support functions to ensure high performance Contact us today for details and support!
Our brand new Rigaku SmartLab X-ray Diffractometer has recently been installed and commissioned at Surface Science Western (SSW). This versatile instrument is capable of analyzing powder samples, solid metal samples, and thin films. The In-Plane diffraction attachment allows the measurement of structural factors and reciprocal space maps from ultra thin (~100 nm thick) films and...