The relative distribution of adsorbed species on mineral grains is routinely analyzed by time-of-flight secondary ion mass spectrometry (TOF-SIMS). This technique provides information on the surface chemistry of minerals and can identify potential problems with lower recovery and grades related to a variety of mineral processes:
Factors Influencing Flotation
● activators ● depressants ● surface oxidation ● collector loadings
Mineral Chemistry and Leach Products
● preg-robbing ● surface coatings: Ag, Hg, Cu ● refractory gold minerals
Roasting/AC POX/CIL Circuits
● refractory gold locking ● preg-robbing ● encapsulation
Examples of experimental studies involving trace element analysis and mineral surface chemistry are presented in the Application Notes.
Upon request, we will recommend to our client, specific optimized study proposals that would best address their needs. In addition, we offer a variety of standard service packages for the most common applications of micro-beam analytical techniques in the mineral processing industry. Descriptions of the standard service packages and related fees are provided in the corresponding links below.