20 June 2013

Cameca 6f Dynamic SIMS Installation

Cameca 6f
We are very happy to announce the installation of a Cameca 6f Dynamic SIMS instrument at SSW. The 6f instrument will complement our upgraded 3f SIMS, thereby improving SSW’s capability to provide quality analytical SIMS analyses to our clients.

The 6f SIMS incorporates many advanced features that improve the quality of the data provided. Elemental analysis of the entire periodic table is possible with detection limits of 200-300 ppb.

The SIMS technique is typically used to analyse semi-conductor devices, geological samples, multi-layered structures, coatings, etc.

Please contact SSW for more information on how Dynamic SIMS analysis can help you.

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