X-ray Diffraction (XRD)

X-ray Diffraction

Technique:
X-ray Diffraction (XRD) is an analytical technique used to identify phases in a wide variety of crystalline materials, such as minerals, corrosion products, thin films, bulk materials and polymers.

Rigaku SmartLab XRD

Rigaku SmartLab XRD at SSW

Instrument:
The Rigaku SmartLab is a highly automated, multipurpose X-ray diffractometer (XRD). This fully loaded system is a high-resolution XRD equipped with a Cross Beam Optics (CBO) system and a high-precision theta-theta goniometer featuring a horizontal sample mount and a 2D HyPix-3000 detector. The HyPix-3000 is a hybrid multi-dimensional detector with a large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel and a fast readout speed. The system features a 2.2 kW long-fine focus X-ray tube (Cu X-ray) with a focal spot of 0.4 mm x 12 mm.
The system incorporates a high-resolution θ/θ closed loop goniometer drive system with an available in-plane diffraction arm. Rigaku’s patented cross beam optics (CBO) allows rapid switching between parafocusing geometry for powder samples and parallel beam geometry for thin films and epitaxial layers.

System Capabilities:
Powder materials: phase identification, crystalline strain and size, crystallinity, structural analysis and refinement (Rietveld and RIR methods), stress measurement and transmission.
Thin films: structural analysis, texture analysis, in-plane diffraction, crystal quality analysis (rocking curve and reciprocal space mapping), high resolution X-ray diffraction and reflectivity (HRXRD and HRXRR), GIXRD depth profiles, 2D stress and PF measurement.
Small-angle X-ray scattering (SAXS): particle/pore size distribution and correlation length analysis, nanoscale structural analysis.

Rigaku SmartLab XRD Sample Analysis Chamber

Rigaku SmartLab XRD Sample Analysis Chamber

Analysis Software:

  • Crystallinity determination module
  • Crystallite size and lattice strain determination module
  • Residual stress analysis module
  • PDXL quantitative analysis package
  • Whole pattern Fitting/Rietveld
  • GlobalFit Reflectivity
  • NanoSolver SAXS Analysis Software
  • 2-Dimensional Data Processing Software

Databases:

  • PDF-4+ Database
  • Crystallography Open Database (COD)
  • FIZ/NIST Inorganic Crystal Structure Database (ICSD)