Analytical Services

SSW offers clients a range of high-quality analytical services and cost-effective access to the latest in analysis technology and techniques.

In fact, SSW’s reputation for high-quality analytics and client consultation has earned it an ISO 9001:2015 standing, the only Canadian university-based surface and material analysis organization of its kind to hold such an important designation. SSW services include:

• Dynamic SIMS – Secondary Ion Mass Spectrometry
• ToF-SIMS – Time-of-Flight Secondary Ion Mass Spectrometry
• SEM/EDX – Scanning Electron Microscopy combined with Energy Dispersive X-ray Spectroscopy
• XPS – X-ray Photoelectron Spectroscopy
• Laser Raman Spectroscopy
• SAM/AES – Scanning Auger Microprobe/Auger Electron Spectroscopy
• Surface Profilometry
• AFM – Atomic Force Microscopy
• X-ray Micro Computed Tomography (Micro-CT)
• Weathering Chambers

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