SSW offers clients a range of high quality analytical services and cost-effective access to the latest in analysis technology and techniques.
In fact, SSW’s reputation for high-quality analytics and client consultation has earned it an ISO 9001:2015 standing, the only Canadian university based surface and material analysis organization of its kind to hold such an important designation. SSW services include:
- Dynamic SIMS – Secondary Ion Mass Spectrometry
- ToF-SIMS – Time-of-Flight Secondary Ion Mass Spectrometry
- SEM/EDX – Scanning Electron Microscopy combined with Energy Dispersive X-ray Spectroscopy
- XPS – X-ray Photoelectron Spectroscopy
- Laser Raman Spectroscopy
- SAM/AES – Scanning Auger Microprobe/Auger Electron Spectroscopy
- Surface Profilometry
- AFM – Atomic Force Microscopy
- X-ray Micro Computed Tomography (Micro-CT)