Analysis Request
(519) 661-2173
About Us
Our Team
ISO 17025:2017 Certification
FAQ
Analysis Request
Industrial Solutions
Solutions Column 1
Aerospace
Automotive
Defence
Electronics
Solutions Column 2
Energy and Nuclear Power
Environmental
Medical/Health
Mining and Mineralogy
Analytical Services
Services A-L
Atomic Force Microscopy (AFM)
Auger Electron Spectroscopy (AES)
Confocal Laser Scanning Microscopy (CLSM)
Contact Angle
Corrosion and Electrochemistry
Differential Scanning Calorimetry (DSC)
Dynamic SIMS (D-SIMS)
Fourier Transform Infrared Spectroscopy (FTIR)
Laser Raman Spectroscopy
Services M-T
Microhardness Testing
Optical Microscopy
SEM/EDX
Sample Preparation and Processing
Surface Profilometry
Thermogravimetric Analysis (TGA)
Time-of-Flight SIMS (ToF-SIMS)
Tribological Testing
Services U-Z
UV-Vis Spectroscopy
Weathering Chambers
X-ray Photoelectron Spectroscopy (XPS)
X-ray Diffraction (XRD)
X-Ray Micro-Computed Tomography (Micro-CT)
Partner Facilities
Training and Courses
Sample Submission
Research
Research Highlights
Publications
Patents
Information for Academics
News
Contact
Analysis Request
(519) 661-2173
About Us
Our Team
ISO 17025:2017 Certification
FAQ
Analysis Request
Industrial Solutions
Aerospace
Automotive
Defence
Electronics
Energy and Nuclear Power
Environmental
Medical/Health
Mining and Mineralogy
Analytical Services
Atomic Force Microscopy (AFM)
Auger Electron Spectroscopy (AES)
Confocal Laser Scanning Microscopy (CLSM)
Contact Angle
Corrosion and Electrochemistry
Differential Scanning Calorimetry (DSC)
Dynamic SIMS (D-SIMS)
Fourier Transform Infrared Spectroscopy (FTIR)
Laser Raman Spectroscopy
Microhardness Testing
Optical Microscopy
SEM/EDX
Sample Preparation and Processing
Surface Profilometry
Thermogravimetric Analysis (TGA)
Time-of-Flight SIMS (ToF-SIMS)
Tribological Testing
UV-Vis Spectroscopy
Weathering Chambers
X-ray Photoelectron Spectroscopy (XPS)
X-ray Diffraction (XRD)
X-Ray Micro-Computed Tomography (Micro-CT)
Partner Facilities
Training and Courses
Sample Submission
Research
Research Highlights
Publications
Patents
Information for Academics
News
Contact
Jeff
