Ready for work – Our Brand New KLA P-17 Stylus Profiler!

The P-17 offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R&D environments. The system supports 2D and 3D measurements of step heights, roughness, bow and stress for scans up to 200mm without stitching.

Contact Info


 Surface Science Western
       999 Collip Circle (LL31)
       London, Ontario, N6G 0J3
       Canada

 sswinfo@uwo.ca
  +1 (519) 661-2173

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