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Solutions Column 2
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Services A-F
Atomic Force Microscopy (AFM)
Auger Electron Spectroscopy (AES)
Confocal Laser Scanning Microscopy (CLSM)
Contact Angle
Corrosion and Electrochemistry
Differential Scanning Calorimetry (DSC)
Dynamic SIMS (D-SIMS)
Fourier Transform Infrared Spectroscopy (FTIR)
Services L-T
Laser Raman Spectroscopy
Microhardness Testing
Optical Microscopy
SEM/EDX
Sample Preparation and Processing
Surface Profilometry
Thermogravimetric Analysis (TGA)
Time-of-Flight SIMS (ToF-SIMS)
Services W-X
Weathering Chambers
X-ray Photoelectron Spectroscopy (XPS)
X-ray Diffraction (XRD)
X-Ray Micro-Computed Tomography (Micro-CT)
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Analysis Request
Customer Testimonials
FAQ
Sitemap
Home
About
Our Team
Customer Testimonials
ISO 17025:2017 Certification
Client Care Approach
FAQ
Analysis Request
Request a Lab Tour
Industrial Solutions
Aerospace
Automotive
Defence
Electronics
Energy and Nuclear Power
Environmental
Medical/Health
Mining and Mineralogy
Analytical Services
Atomic Force Microscopy (AFM)
Auger Electron Spectroscopy (AES)
Confocal Laser Scanning Microscopy (CLSM)
Contact Angle
Corrosion and Electrochemistry
Differential Scanning Calorimetry (DSC)
Dynamic SIMS (D-SIMS)
Fourier Transform Infrared Spectroscopy (FTIR)
Laser Raman Spectroscopy
Microhardness Testing
Optical Microscopy
SEM/EDX
Sample Preparation and Processing
Surface Profilometry
Thermogravimetric Analysis (TGA)
Time-of-Flight SIMS (ToF-SIMS)
Weathering Chambers
X-ray Photoelectron Spectroscopy (XPS)
X-ray Diffraction (XRD)
X-Ray Micro-Computed Tomography (Micro-CT)
Partner Facilities
Training and Courses
Sample Submission
Research
Patents
Publications
Information for Academics
News & Events
Contact
Sitemap
About
Client Care Approach
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FAQ
ISO 17025:2017 Certification
Our Team
Dr. Brian Hart
Dr. Heng-Yong Nie
Dr. Stamen Dimov
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Dr. Mark Biesinger
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Industrial Solutions
Aerospace
Automotive
Blister Defects in Rubber Door Trim
Crater Defects on Fuel Doors
Failure of Foam Adhesive on Painted Side Panels
Pinhole Defects on Car Hoods
Raman Spectroscopy of Pigments
Tof-SIMS Analysis of Crater Defect
Characterization of Microplastics
Defence
Electronics
Energy and Nuclear Power
Environmental
Medical/Health
Mining and Mineralogy
Analytical Techniques and Instrumentation Related to Mineral Processing
Application Notes
Characterization of passivating coatings on gold grains from carbon in leach (CIL) residue sample by TOF-SIMS
Deportment of gold in an autoclave pressure oxidation (AC-POX))/carbon in leach (CIL) residue
Determination of Surface Gold Preg-Robbed on Carbonaceous Matter From Autoclave Pressure Oxidation (Ac Pox)/Carbon in Leach (Cil) Stream Products
Feed Ore Characterization: Ore Chemical Activity Testing by TOF-SIMS
Quantitative D-Sims Analysis of Sub-Microscopic Gold in Sulphide Minerals
Surface chemistry in relation to flotation selectivity: TOF-SIMS surface analysis of mineral phases from metallurgical tests in flotation circuits
Mineral Processing Analytical Services and Fees
Abbreviated metallurgical study
Abbreviated quantitative screening for carriers of precious metals in ore samples
Characterization of discharge samples from AC-POX/CIL circuits by SEM/EDX and AES
Deportment of gold in discharge samples from AC-POX/CIL circuits
Determination of surface gold preg-robbed on carbonaceous matter from AC-POX /CIL stream products
Feed ore characterization: ore chemical activity testing by TOF-SIMS
Quantitative D-SIMS analysis of sub-microscopic gold in sulphide minerals
Analytical Services
Atomic Force Microscopy (AFM)
Auger Electron Spectroscopy (AES)
Confocal Laser Scanning Microscopy (CLSM)
Contact Angle
Corrosion and Electrochemistry
Differential Scanning Calorimetry (DSC)
Dynamic SIMS (D-SIMS)
Fourier Transform Infrared Spectroscopy (FTIR)
Laser Raman Spectroscopy
Microhardness Testing
Optical Microscopy
Partner Facilities
Sample Preparation and Processing
SEM/EDX
Surface Profilometry
Thermogravimetric Analysis (TGA)
Time-of-Flight SIMS (ToF-SIMS)
Training and Courses
Weathering Chambers
X-ray Diffraction (XRD)
X-Ray Micro-Computed Tomography (Micro-CT)
X-ray Photoelectron Spectroscopy (XPS)
Sample Submission
Research
Patents
Publications
Information for Academics
Contact
