11 June 2019

Surface and Micro-Nanoscale Analysis: Materials Characterization Problems in Industry Workshop

On May 1, 2019 Surface Science Western jointly hosted (with Western University, the Canadian Centre for Electron Microscopy (CCEM), McMaster University, and the Canadian Light Source (CLS), Saskatoon) a workshop on an introduction to surface and microanalysis techniques, including how they work and what type of information can be obtained. Numerous industrial applications were presented. Tours of Surface Science Western’s facilities showcasing their new set of state-of-the art equipment were also provided to attendees.

Attached are some of the presentations provided during this workshop:

Toby Bond – Imaging Microstructure Dynamics Using Synchrotron-Based Computed Tomography

Sridhar Ramamurthy – X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES)

Mark Biesinger – Surface Science Western

Jeff Cutler – The Canadian Light Source – The Nation’s Brightest Light

Brad Kobe – SEM, EDX, XRD

Toby Bond – Imaging Microstructure Dynamics Using Synchrotron-Based Computed Tomography

Mary Jane Walzak – Fourier Transform Infrared Spectroscopy (FTIR) and Raman Spectroscopy

Joel Reid – Materials Analysis Using X-Ray Absorption Spectroscopy (XAS) Techniques

Jamie Noel – Electrochemical Techniques

Brian Langelier – Atom Probe Tompgraphy

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