Surface and Micro-Nanoscale Analysis: Materials Characterization Problems in Industry Workshop

On May 1, 2019 Surface Science Western jointly hosted (with Western University, the Canadian Centre for Electron Microscopy (CCEM), McMaster University, and the Canadian Light Source (CLS), Saskatoon) a workshop on an introduction to surface and microanalysis techniques, including how they work and what type of information can be obtained. Numerous industrial applications were presented. Tours of Surface Science Western’s facilities showcasing their new set of state-of-the art equipment were also provided to attendees.
Attached are some of the presentations provided during this workshop:
Toby Bond – Imaging Microstructure Dynamics Using Synchrotron-Based Computed Tomography
Sridhar Ramamurthy – X-ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES)
Mark Biesinger – Surface Science Western
Jeff Cutler – The Canadian Light Source – The Nation’s Brightest Light
Brad Kobe – SEM, EDX, XRD
Toby Bond – Imaging Microstructure Dynamics Using Synchrotron-Based Computed Tomography
Mary Jane Walzak – Fourier Transform Infrared Spectroscopy (FTIR) and Raman Spectroscopy
Joel Reid – Materials Analysis Using X-Ray Absorption Spectroscopy (XAS) Techniques
Jamie Noel – Electrochemical Techniques
Brian Langelier – Atom Probe Tompgraphy

Contact Info


 Surface Science Western
       999 Collip Circle (LL31)
       London, Ontario, N6G 0J3
       Canada

 sswinfo@uwo.ca
  +1 (519) 661-2173

FOLLOW US