SEM, accompanied by X-ray analysis, is considered a relatively rapid, inexpensive, and basically non-destructive approach to surface analysis. It is often used to survey surface analytical problems before proceeding to techniques that are more surface-sensitive and specialized.
Hitachi S-4500 field emission SEM with a Quartz XOne EDX system
LEO 440 SEM equipped with a Gresham light element detector and a Quartz XOne EDX system
Selected Applications in Industry: